FRACTAL CHARACTER OF COLD-DEPOSITED SILVER FILMS DETERMINED BY LOW-TEMPERATURE SCANNING-TUNNELING-MICROSCOPY

Authors
DOUKETIS C WANG ZH HASLETT TL MOSKOVITS M
Citation
C. Douketis et al., FRACTAL CHARACTER OF COLD-DEPOSITED SILVER FILMS DETERMINED BY LOW-TEMPERATURE SCANNING-TUNNELING-MICROSCOPY, Physical review. B, Condensed matter, 51(16), 1995, pp. 11022-11031
Citations number
34
Categorie Soggetti
Physics, Condensed Matter
Journal title
Physical review. B, Condensed matter → ACNP
ISSN journal
01631829
Volume
51
Issue
16
Year of publication
1995
Pages
11022 - 11031
Database
ISI
SICI code
0163-1829(1995)51:16<11022:FCOCSF>2.0.ZU;2-S