DETERMINATION OF MODE-CUTOFF WAVELENGTHS AND REFRACTIVE-INDEX PROFILEOF PLANAR OPTICAL WAVE-GUIDES WITH A PHOTON SCANNING TUNNELING MICROSCOPE

Citation
E. Bourillot et al., DETERMINATION OF MODE-CUTOFF WAVELENGTHS AND REFRACTIVE-INDEX PROFILEOF PLANAR OPTICAL WAVE-GUIDES WITH A PHOTON SCANNING TUNNELING MICROSCOPE, Physical review. B, Condensed matter, 51(16), 1995, pp. 11225-11228
Citations number
23
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
51
Issue
16
Year of publication
1995
Pages
11225 - 11228
Database
ISI
SICI code
0163-1829(1995)51:16<11225:DOMWAR>2.0.ZU;2-O