POSITRON-ANNIHILATION IN NARROW-GAP SEMICONDUCTORS

Citation
N. Bouarissa et al., POSITRON-ANNIHILATION IN NARROW-GAP SEMICONDUCTORS, Physica status solidi. b, Basic research, 188(2), 1995, pp. 723-734
Citations number
48
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
03701972
Volume
188
Issue
2
Year of publication
1995
Pages
723 - 734
Database
ISI
SICI code
0370-1972(1995)188:2<723:PINS>2.0.ZU;2-H
Abstract
The valence electron and positron charge densities in InAs and InSb ar e obtained from wave functions derived in a model pseudopotential band -structure calculation. It is found that the positron density is maxim um in the open interstices and is excluded not only, as usual, from th e ion cores but also to a considerable degree from the valence bonds. Electron-positron momentum densities are calculated for the (001-110) plane. The results are used to analyze the positron effect in narrow-g ap semiconductors.