OBSERVATION OF CURRENT-DENSITY FILAMENTATION IN MULTILAYER STRUCTURESBY EBIC MEASUREMENTS

The total current-voltage characteristics of the p(+)-n(+)-p-n(-) and n(+)-p-n-p(-) diodes under investigation show branches of negative dif ferential resistance. Accompanied by the appearance of negative differ ential resistance is a filamentation of current-density and electric-f ield distribution. Electron beam-induced current (EBIC) measurements w ere used to examine the properties of filamentation from the point of view of self-organized pattern formation. Besides the detection of the spatial distribution of the electric field, EBIC measurements give in formation on current-density filamentation. Furthermore, the perturbat ion by the electron beam gives information on the dynamic behavior of the filamentary structure.