APPLICATION OF SINGLE-ELECTRON TUNNELING - PRECISION CAPACITANCE RATIO MEASUREMENTS

Citation
Af. Clark et al., APPLICATION OF SINGLE-ELECTRON TUNNELING - PRECISION CAPACITANCE RATIO MEASUREMENTS, Applied physics letters, 66(19), 1995, pp. 2588-2590
Citations number
10
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
66
Issue
19
Year of publication
1995
Pages
2588 - 2590
Database
ISI
SICI code
0003-6951(1995)66:19<2588:AOST-P>2.0.ZU;2-0