MICROSTRUCTURAL FEATURES OF CD0.8ZN0.2 TE THIN-FILMS STUDIED BY X-RAY-DIFFRACTION AND ELECTRON-MICROSCOPY

Thin films of synthesized Cd0.8Zn0.2Te have been deposited on glass su bstrate at different substrate temperatures. Different microstructural parameters like crystallite size, rms strain, dislocation density, st acking fault probability and stacking fault energy are determined by X RD, SEM, TEM and TED. XRD and XPS have been used to determine the comp osition. Variations of the microstructural parameters with film thickn ess and substrate temperature have been studied in order to obtain opt imum growth condition for maximum particle size and least microstructu ral defects. An effort has been made to correlate the experimental res ults.