MECHANICAL HYSTERESIS ON AN ATOMIC-SCALE

Citation
K. Cho et Jd. Joannopoulos, MECHANICAL HYSTERESIS ON AN ATOMIC-SCALE, Surface science, 328(3), 1995, pp. 320-324
Citations number
5
Categorie Soggetti
Chemistry Physical
Journal title
ISSN journal
00396028
Volume
328
Issue
3
Year of publication
1995
Pages
320 - 324
Database
ISI
SICI code
0039-6028(1995)328:3<320:MHOAA>2.0.ZU;2-S
Abstract
A micromechanical hysteresis associated with intimate atomic force mic roscopy (AFM) on the Si(100) surface is discovered using ab initio tot al energy pseudopotential density functional calculations. It is predi cted that it is possible to cycle repeatedly between two buckled confi gurations of a surface dimer along two different paths, one of which i nvolves a discontinuous change of the equilibrium dimer-angle, by vary ing appropriately the vertical movement of the AFM tip. This microscop ic mechanical hysteresis effect should be detectable experimentally in low temperature AFM measurements.