ADAPTIVE UNANIMOUS VOTING (UV) SCHEME FOR DISTRIBUTED SELF-DIAGNOSIS

Distributed self-diagnosis approach proposed for multiprocessor system s is also effective for integrated circuit wafers containing a number of identical circuits. Here the testing of each node is based on the m ajority voting on the test results from itself and neighboring nodes. In this paper, we identify that the unanimous voting (UV) approach alw ays outperforms the individual voting (IV) approach, irrespective of t he number of voting cells and fault rate. Based on the UV approach, th e optimal number of tests is obtained. We also introduce an adaptive v oting scheme by which the test overhead of the traditional voting sche mes can be significantly reduced.