The presence of silicon in rice husk has been established by its chemi
cal and thermal degradation. The bonding between Si and C have been st
udied by IR spectroscopy. The existence of IR peak at similar to 800 c
m(-1) shows SI-C bonding in raw rice husk, which is shifted to 790 cm(
-1) during coking and pyrolysis. ESCA study of surface showed Si, C, O
and F to be present; Si in the form of SICx and SiOx and C as SiCx an
d CHx. On sputtering, the SiOx and CHx species decrease with increase
of SiCx level. The formation of SiC from coked rice husk and Si3N4 and
Si2N2O from HCl treated rice husk has been observed at 1200-1400 degr
ees C under N-2 and NH3 atmosphere, respectively. The chemical analysi
s of raw rice husk and products are tabulated. The XRD analyses shows
the presence of different phases in the products. A new mechanism for
the development of these ceramic materials has been proposed.