PROPERTIES OF PLASMA RADIATION DIAGNOSTICS

Authors
Citation
Gc. Idzorek et H. Oona, PROPERTIES OF PLASMA RADIATION DIAGNOSTICS, Review of scientific instruments, 68(1), 1997, pp. 1065-1068
Citations number
19
Categorie Soggetti
Physics, Applied","Instument & Instrumentation
ISSN journal
00346748
Volume
68
Issue
1
Year of publication
1997
Part
2
Pages
1065 - 1068
Database
ISI
SICI code
0034-6748(1997)68:1<1065:POPRD>2.0.ZU;2-Q
Abstract
A number of diagnostics utilizing the radiation emitted from high-temp erature plasmas have been developed at Los Alamos. Photoemissive x-ray diodes with photon energy bandpass filters provide time-resolved roug h spectral data from about 6 eV to > 10 keV photon energy. Filtered si licon photodiodes can be used down to 1 eV and offer the advantages of nominally hat response and ability to operate in poor vacuum conditio ns. Both types of diodes will provide a rough time-resolved spectrum a nd both are relatively inexpensive, reliable, and passive (i.e., no sy nchronization problems). For higher-energy resolution, bent crystal sp ectrographs are used in the x-ray region. With the addition of streak cameras or gated microchannel plates these systems provide data with h igh energy and high time resolution. To measure the total energy outpu t, a thin foil bolometer is used that measures the change in foil resi stance as it is heated by the plasma radiation. By combining these dia gnostics into a complementary set good diagnostic information can be g uaranteed on any plasma experiment.