SOFT-X-RAY AND AUGER-ELECTRON SPECTROSCOPY OF SINGLE AND DOUBLE-ELECTRON CAPTURE PROCESSES IN SLOW NE8++HE COLLISIONS

Authors
BLIMAN S CORNILLE M LANGEREIS A NORDGREN J BRUCH R PHANEUF R SWENSON J SCHNEIDER D
Citation
S. Bliman et al., SOFT-X-RAY AND AUGER-ELECTRON SPECTROSCOPY OF SINGLE AND DOUBLE-ELECTRON CAPTURE PROCESSES IN SLOW NE8++HE COLLISIONS, Review of scientific instruments, 68(1), 1997, pp. 1080-1082
Citations number
17
Categorie Soggetti
Physics, Applied","Instument & Instrumentation
Journal title
Review of scientific instruments → ACNP
ISSN journal
00346748
Volume
68
Issue
1
Year of publication
1997
Part
2
Pages
1080 - 1082
Database
ISI
SICI code
0034-6748(1997)68:1<1080:SAASOS>2.0.ZU;2-#
Abstract
We have performed high resolution extreme ultraviolet (EUV) photon and Auger electron measurements to elucidate single and double capture pr ocesses in Ne8++He single collisions at 80 keV impact energy. Numerous new transitions both in the Auger and the EUV spectra have been ident ified by means of extensive theoretical calculations and correlation d iagrams. These data are of importance for the modeling of impurities i n plasma and for future plasma diagnostics. (C) 1997 American Institut e of Physics.