P. Rejmankova et al., AN X-RAY TOPOGRAPHIC INVESTIGATION OF ALPHA-LIIO3 UNDER A DIRECT OR ALTERNATING-CURRENT ELECTRIC-FIELD, Journal of physics. D, Applied physics, 28(4A), 1995, pp. 69-73
The changes in the light, neutron and x-ray diffracted intensities obs
erved when an electric field is applied to crystals of alpha-LilO(3) a
re not yet fully understood. In the present paper, after summarizing t
he already known diffraction topographic experimental results, we pres
ent new ones obtained mainly by the use of section topographs. The dis
cussion tries to establish connections between these data, and conside
rs their origins. In particular, the present investigation shows that
the majority of the enhanced diffracted intensity originates from smal
l areas, which seem to correspond to growth bands. The influence of th
e nature and inhomogeneities of the electrodes is also considered. Fin
ally, we describe the results of topographic experiments and conductiv
ity measurements under an alternating electric field.