AN X-RAY TOPOGRAPHIC INVESTIGATION OF ALPHA-LIIO3 UNDER A DIRECT OR ALTERNATING-CURRENT ELECTRIC-FIELD

Citation
P. Rejmankova et al., AN X-RAY TOPOGRAPHIC INVESTIGATION OF ALPHA-LIIO3 UNDER A DIRECT OR ALTERNATING-CURRENT ELECTRIC-FIELD, Journal of physics. D, Applied physics, 28(4A), 1995, pp. 69-73
Citations number
18
Categorie Soggetti
Physics, Applied
ISSN journal
00223727
Volume
28
Issue
4A
Year of publication
1995
Pages
69 - 73
Database
ISI
SICI code
0022-3727(1995)28:4A<69:AXTIOA>2.0.ZU;2-N
Abstract
The changes in the light, neutron and x-ray diffracted intensities obs erved when an electric field is applied to crystals of alpha-LilO(3) a re not yet fully understood. In the present paper, after summarizing t he already known diffraction topographic experimental results, we pres ent new ones obtained mainly by the use of section topographs. The dis cussion tries to establish connections between these data, and conside rs their origins. In particular, the present investigation shows that the majority of the enhanced diffracted intensity originates from smal l areas, which seem to correspond to growth bands. The influence of th e nature and inhomogeneities of the electrodes is also considered. Fin ally, we describe the results of topographic experiments and conductiv ity measurements under an alternating electric field.