AN X-RAY-DIFFRACTION TOPOGRAPHIC STUDY OF HIGHLY ORIENTED PYROLYTIC-GRAPHITE

Citation
M. Ohler et al., AN X-RAY-DIFFRACTION TOPOGRAPHIC STUDY OF HIGHLY ORIENTED PYROLYTIC-GRAPHITE, Journal of physics. D, Applied physics, 28(4A), 1995, pp. 78-83
Citations number
38
Categorie Soggetti
Physics, Applied
ISSN journal
00223727
Volume
28
Issue
4A
Year of publication
1995
Pages
78 - 83
Database
ISI
SICI code
0022-3727(1995)28:4A<78:AXTSOH>2.0.ZU;2-7
Abstract
Highly oriented pyrolytic graphite is a very efficient and well-known x-ray and neutron monochromator that is obtained by thermal cracking o f a hydrocarbon gas and a subsequent graphitization treatment. Its mic rostructure is still, however, a matter of controversy. Several sample s of different quality were extensively studied by x-ray diffraction t opography. The contrast obtained on 00l reflections is mainly explaine d in terms of 'primary extinction' acid orientation contrast. This imp lies that the interlayer spacing of the graphite lattice planes remain s constant over distances of several tens of micrometres. Graphitizati on mechanisms are discussed in the light of this interpretation. A mic rostructural model, closely related to that of as-deposited pyrolytic carbon, is proposed.