OBSERVATION OF DEFECTS IN CRYSTAL-SURFACE LAYERS BY GRAZING-INCIDENCEDIFFRACTION X-RAY TOPOGRAPHY

Authors
NOVIKOV DV OHLER M KOHLER R MATERLIK G
Citation
Dv. Novikov et al., OBSERVATION OF DEFECTS IN CRYSTAL-SURFACE LAYERS BY GRAZING-INCIDENCEDIFFRACTION X-RAY TOPOGRAPHY, Journal of physics. D, Applied physics, 28(4A), 1995, pp. 84-87
Citations number
19
Categorie Soggetti
Physics, Applied
Journal title
Journal of physics. D, Applied physics → ACNP
ISSN journal
00223727
Volume
28
Issue
4A
Year of publication
1995
Pages
84 - 87
Database
ISI
SICI code
0022-3727(1995)28:4A<84:OODICL>2.0.ZU;2-U
Abstract
Threading dislocations in gallium arsenide and point defects in silico n were observed for the first time by x-ray topography under grazing-i ncidence diffraction conditions. A new type of contrast on polished su rfaces has been resolved for single crystals with defects. The charact eristics of grazing-incidence diffraction topography are discussed.