HIGH-RESOLUTION X-RAY CHARACTERIZATION OF PERIODICALLY DOMAIN-INVERTED NONLINEAR-OPTICAL CRYSTALS

Citation
Zw. Hu et al., HIGH-RESOLUTION X-RAY CHARACTERIZATION OF PERIODICALLY DOMAIN-INVERTED NONLINEAR-OPTICAL CRYSTALS, Journal of physics. D, Applied physics, 28(4A), 1995, pp. 189-194
Citations number
18
Categorie Soggetti
Physics, Applied
ISSN journal
00223727
Volume
28
Issue
4A
Year of publication
1995
Pages
189 - 194
Database
ISI
SICI code
0022-3727(1995)28:4A<189:HXCOPD>2.0.ZU;2-R
Abstract
A high-resolution triple-axis diffractometer has been used for the str uctural characterization of periodically domain-inverted nonlinear opt ical crystals of KTiOPO4 and LiNbO3. Striations have been revealed in high-strain-sensitivity multiple-crystal topographs of the domain-inve rted regions of both these samples and these are dominated by orientat ion contrast. The combination of high-resolution reciprocal-space mapp ing and topography has shown that the extended diffraction streak in t he q([)2(1) over bar0$] direction for the domain-inverted LiNbO3 origi nates from the 'minutely misonented structure' which is related to the original configuration of dislocations. The reason for the generation of the structural imperfections via the domain-inversion processing i s interpreted in terms of the converse piezoelectric effect.