DETERMINATION OF YBACUO THIN-LAYER STRUCTURAL PARAMETERS BY USING HIGH-RESOLUTION X-RAY-DIFFRACTOMETRY

YBa2Cu3O7-x thin layers grown with a magnetron sputtering technique ha ve been thoroughly investigated by using various x-ray diffractometry schemes. High-resolution triple-crystal setting has proved to be a pow erful tool for identifying basic types of damage: out-of-plane grain m isorientations, microstrain and grain size. By using double-axis modes , layer thickness and composition were extracted. The lattice paramete r c of the layer was measured and discussed in comparison with that of bulk high-temperature superconducter crystals. The results obtained h ave promoted an essential extension of the range of the YBaCuO layer s tructural characteristics.