X-RAY-DIFFRACTION FROM MESOSCOPIC SYSTEMS - THIN-FILMS ON ROUGH SURFACES

In this work x-ray diffraction measurements on thin polystyrene films deposited on laterally structured surfaces are reported. The experimen ts were performed in the region of small incidence and exit angles. Th e x-ray data are compared with the results of atomic force microscopy investigations, both being performed to obtain the morphology of the p olymer film on top of the surface grating. Our results do not confirm existing theoretical predictions assuming pure van der Waals interacti ons between the substrate and the film.