TRANSMISSION ELECTRON-MICROSCOPY AT THE MAX-PLANCK-INSTITUT FUR METALLFORSCHUNG

An overview is given on the different instruments and methods in trans mission electron microscopy which are present at the Max-Planck-Instit ut fur Metallforschung and on their possible applications. Advanced te chniques are described which offer quantitative, atomicscale informati on on structure, chemical composition and bonding at internal boundari es. Results on the Cu/Al2O3 interface are presented as an example. It is shown that only the use of complementary techniques allows a charac terization of the interface structure at atomic level.