STUDIES OF THE MICROSTRUCTURE AND NANOSTRUCTURE OF POLYCRYSTALLINE CDTE AND CUINSE2 USING ATOMIC-FORCE AND SCANNING-TUNNELING-MICROSCOPY

Citation
Hr. Moutinho et al., STUDIES OF THE MICROSTRUCTURE AND NANOSTRUCTURE OF POLYCRYSTALLINE CDTE AND CUINSE2 USING ATOMIC-FORCE AND SCANNING-TUNNELING-MICROSCOPY, Progress in photovoltaics, 3(1), 1995, pp. 39-46
Citations number
19
Categorie Soggetti
Energy & Fuels","Physics, Applied
Journal title
ISSN journal
10627995
Volume
3
Issue
1
Year of publication
1995
Pages
39 - 46
Database
ISI
SICI code
1062-7995(1995)3:1<39:SOTMAN>2.0.ZU;2-0
Abstract
Atomic force microscopy (AFM) and scanning tunneling microscopy (STM) have been used to study the micro- and nanostructure of CdTe and CuInS e2 thin films used for photovoltaic cells. Topographic images ape comp arable with those reported previously using conventional scanning elec tron microscopy (SEM)-to the limit spatial resolution of the SEM techn ique. For higher magnifications, nanoscale structures and features hav e been observed for the first time with, AFM and STM, and these observ ations have implications for the suitability and preparation of these semiconductors for high-efficiency solar cell realization.