KINETIC MODELING OF SILANE SURFACE-REACTIONS

Citation
R. Zuo et al., KINETIC MODELING OF SILANE SURFACE-REACTIONS, Journal of the Electrochemical Society, 142(5), 1995, pp. 1625-1629
Citations number
18
Categorie Soggetti
Electrochemistry
ISSN journal
00134651
Volume
142
Issue
5
Year of publication
1995
Pages
1625 - 1629
Database
ISI
SICI code
0013-4651(1995)142:5<1625:KMOSS>2.0.ZU;2-X
Abstract
A detailed kinetic modeling for SiH4/H-2 surface reactions on Si(111)- (7 x 7) surface during chemical vapor deposition is presented. Based o n the conservation of adsorbed species at steady state, an analytical expression for growth rate (GR) as a function of surface temperature, silane and hydrogen partial pressures is derived. By curve fitting to previously reported experimental values, preexponential coefficients a nd activation energies in the GR formula are further derived. Predicti ons of Gr, E(app), and T-tr under different growth parameters are give n and compared to literature values. The model is further extended to SiH4/H-2 mixture surface reactions thus the reaction orders of SiH4 an d H-2 are predicted. Good agreements with literature values are obtain ed under low pressure conditions.