ELECTRICAL CHARACTERIZATION OF AU SCHOTTKY CONTACT ON N-TYPE CD0.99MN0.01TE

Citation
J. Szatkowski et al., ELECTRICAL CHARACTERIZATION OF AU SCHOTTKY CONTACT ON N-TYPE CD0.99MN0.01TE, Vacuum, 46(5-6), 1995, pp. 545-546
Citations number
3
Categorie Soggetti
Physics, Applied
Journal title
VacuumACNP
ISSN journal
0042207X
Volume
46
Issue
5-6
Year of publication
1995
Pages
545 - 546
Database
ISI
SICI code
0042-207X(1995)46:5-6<545:ECOASC>2.0.ZU;2-N
Abstract
The Au/Cd0.99Mn0.01Te interfaces were characterized by current-voltage -temperature (I-V-T) and capacitance-voltage (C-V) measurements. The b arrier height was found to be equal to Phi(BI) = 0.75 +/- 0.05 eV with in the whole measured temperature range.