INFLUENCE OF THE SUBSTRATE CRYSTALLOGRAPHIC ORIENTATION ON THE AUGER SIGNAL INTENSITY

Authors
GUGLIELMACCI JM GRUZZA B
Citation
Jm. Guglielmacci et B. Gruzza, INFLUENCE OF THE SUBSTRATE CRYSTALLOGRAPHIC ORIENTATION ON THE AUGER SIGNAL INTENSITY, Vacuum, 46(5-6), 1995, pp. 595-598
Citations number
19
Categorie Soggetti
Physics, Applied
Journal title
Vacuum → ACNP
ISSN journal
0042207X
Volume
46
Issue
5-6
Year of publication
1995
Pages
595 - 598
Database
ISI
SICI code
0042-207X(1995)46:5-6<595:IOTSCO>2.0.ZU;2-0
Abstract
In this paper, we show that for a single crystal sample, the Auger sig nal intensity depends on the atomic density of the crystalline plane e xposed to the analysis. The theoretical approach, based on the Gallon and on the Seah models, is well confirmed by experimental study carrie d out during the growth of epitaxial gold films on palladium substrate s.