STRUCTURAL STUDY OF RH(100)-C(2X2)-S USING THE NORMAL-INCIDENCE STANDING X-RAY WAVE-FIELD METHOD

Citation
Jr. Mercer et al., STRUCTURAL STUDY OF RH(100)-C(2X2)-S USING THE NORMAL-INCIDENCE STANDING X-RAY WAVE-FIELD METHOD, Surface science, 369(1-3), 1996, pp. 36-44
Citations number
40
Categorie Soggetti
Chemistry Physical
Journal title
ISSN journal
00396028
Volume
369
Issue
1-3
Year of publication
1996
Pages
36 - 44
Database
ISI
SICI code
0039-6028(1996)369:1-3<36:SSORUT>2.0.ZU;2-N
Abstract
The adsorption site for sulphur in the Rh(100)-c(2 x 2)-S system has b een investigated using the normal-incidence standing X-ray wavefield a dsorption (NISXW) technique. Two Bragg reflecting planes were used for the measurements, the (200) plane (parallel to the surface) and the ( 111) plane (inclined 54.7 degrees to the surface). The distance betwee n the S atoms and the surface plane was found to be 1.38+/-0.05 Angstr om. The adsorption site was determined by triangulation of the distanc es between the S atoms and the (200) and (111) planes, coupled with co mparison of the measured coherent fractions with calculations of the e xpected values. The results indicate that S adsorbs in the symmetric f our-fold hollow site, as found for S adsorption on other fcc(100) surf aces.