ELECTRICAL AND OPTICAL CHARACTERIZATION OF ELECTRON-BEAM EVAPORATED IN2SE3 THIN-FILMS

Citation
G. Micocci et al., ELECTRICAL AND OPTICAL CHARACTERIZATION OF ELECTRON-BEAM EVAPORATED IN2SE3 THIN-FILMS, Physica status solidi. a, Applied research, 148(2), 1995, pp. 431-438
Citations number
19
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
00318965
Volume
148
Issue
2
Year of publication
1995
Pages
431 - 438
Database
ISI
SICI code
0031-8965(1995)148:2<431:EAOCOE>2.0.ZU;2-9
Abstract
Electrical and optical measurements are carried out on In2Se3 polycrys talline thin films obtained by electron beam evaporation and thermally annealed at different temperatures. The temperature dependence of Hal l mobility and de conductivity is tentatively explained in terms of Pe tritz's model where the scattering is due to the grain boundaries of t he polycrystallites. The effect of grain sizes on the mobility and the barrier height is also reported. The optical results indicate that th e absorption mechanism is due to an indirect transition. The energy ga p in the as-deposited samples is about 1.40 eV and increases with ther mal annealing.