Ni/Pd multilayered films with various Ni and Pd layer thicknesses were
prepared by electron gun evaporation. These films were all polycrysta
ls with (111) preferential orientation. Also, both experimental analys
is and computer simulation results indicated the existence of a diffus
ion layer at the Ni-Pd interfaces. The nominal magnetic moment per Ni
atom measured for these multilayered films varied with change in the N
i layer thickness. For a thinner Ni layer, the magnetic moment was sma
ller than that of bulk Ni, while it was larger for the thicker Ni laye
r. This variation is attributed to the opposite effects of two factors
, namely the favourable effect of Pd atom polarization versus the magn
etic degradation mainly due to the decrease in the Curie temperature w
ith decreasing Ni layer thickness. The effect of Pd atoms polarized by
their neighbouring Ni atoms was also verified by the results of therm
al annealing the multilayers.