W. Grieshaber et al., A GENERAL-METHOD FOR TENSOR AVERAGING AND AN APPLICATION TO POLYCRYSTALLINE MATERIALS, Solid state communications, 93(10), 1995, pp. 805-809
A general method is presented for determining the average tensorial co
mponents of a physical quantity for a polycrystalline sample with rand
om crystallite orientation, when this tenser is known for a monocrysta
l. The technique, bused on the determination of the rotationally invar
iant pan of the tenser, is very convenient and provides analytical res
ults. Explicit expressions are given for symmetrical 4(th) rank and 8(
th) rank tensors and are applied to calculate piezoresistive effects i
n polycrystalline silicon.