The influence of Y-ion implantation on the oxidation of beta-NiAl sing
le crystals has been investigated using SEM TEM, and STEM. Y ions havi
ng an energy of 70 keV were implanted with a concentration of 5 x 10(1
6) ions/cm(2). The oxidation experiments were per;formed in air at 122
3 K. Y-ion implantation resulted in a 45-nm disordered layer. Oxidatio
n of Y-implanted beta-NiAl leads to the formation of a fine-grain laye
r, consisting of gamma-Al2O3 containing Y and a theta-Al2O3 layer. Aft
er further oxidation the metastable Al2O3 transformed into alpha-Al2O3
, which started at the metal-oxide interface. Y-Al-garnet (YAG) partic
les were observed and Y segregation to alpha-Al2O3 grain boundaries ha
s been detected.