IDENTIFICATION OF VACANCY DEFECTS IN COMPOUND SEMICONDUCTORS BY CORE-ELECTRON ANNIHILATION - APPLICATION TO INP

Authors
ALATALO M KAUPPINEN H SAARINEN K PUSKA MJ MAKINEN J HAUTOJARVI P NIEMINEN RM
Citation
M. Alatalo et al., IDENTIFICATION OF VACANCY DEFECTS IN COMPOUND SEMICONDUCTORS BY CORE-ELECTRON ANNIHILATION - APPLICATION TO INP, Physical review. B, Condensed matter, 51(7), 1995, pp. 4176-4185
Citations number
30
Categorie Soggetti
Physics, Condensed Matter
Journal title
Physical review. B, Condensed matter → ACNP
ISSN journal
01631829
Volume
51
Issue
7
Year of publication
1995
Pages
4176 - 4185
Database
ISI
SICI code
0163-1829(1995)51:7<4176:IOVDIC>2.0.ZU;2-U