DETECTION OF METAL-INDUCED GAP STATES IN SILICON

Authors
RAILKAR TA BHORASKAR SV
Citation
Ta. Railkar et Sv. Bhoraskar, DETECTION OF METAL-INDUCED GAP STATES IN SILICON, Applied physics letters, 66(8), 1995, pp. 974-975
Citations number
11
Categorie Soggetti
Physics, Applied
Journal title
Applied physics letters → ACNP
ISSN journal
00036951
Volume
66
Issue
8
Year of publication
1995
Pages
974 - 975
Database
ISI
SICI code
0003-6951(1995)66:8<974:DOMGSI>2.0.ZU;2-S