A. Gosselin et al., PARTIAL AND TOTAL CROSS-SECTIONS FOR SINGLE-ELECTRON CAPTURE BY AR8-2400-EV ENERGY-RANGE( FROM HE IN THE 400), Journal of physics. B, Atomic molecular and optical physics, 28(3), 1995, pp. 445-456
Charge-exchange processes in 400-2400 eV Ar8+-He collisions are invest
igated: high energy resolution ion beam spectroscopy is performed with
a recoil ion source (RIS) built in GANIL, total and partial cross sec
tions for single-electron capture are measured using retarding field a
nd energy gain techniques. Comparison with previous experimental resul
ts for total charge-exchange cross sections shows a rather good agreem
ent and confirms the independence of these cross sections on the colli
sion energy in the studied range. In contrast partial charge-exchange
cross sections are shown to depend strongly on the collision energy. T
he experimental data are compared with theoretical results in the semi
-classical impact parameter frame and with predictions made by other a
uthors using the Landau-Zener model.