IUD EXPULSION SOLVED WITH IMPLANT TECHNOLOGY

Citation
H. Vankets et al., IUD EXPULSION SOLVED WITH IMPLANT TECHNOLOGY, Contraception, 51(2), 1995, pp. 87-92
Citations number
20
Categorie Soggetti
Obsetric & Gynecology
Journal title
ISSN journal
00107824
Volume
51
Issue
2
Year of publication
1995
Pages
87 - 92
Database
ISI
SICI code
0010-7824(1995)51:2<87:IESWIT>2.0.ZU;2-7
Abstract
In an attempt to minimize the problem of IUD explusion, implantation t echnology has been developed and rested. The trials have extended from 1985 until the present time for interval as well as for immediate pos tabortal and post-placental insertion and fixation of the CuFix IUD (G yneFix (TM)). The present article reports on an ongoing study with Gyn eFix (TM) interval insertion, with an improved inserter, in 820 women, observed up to 3 years, of whom 213 (25.9%) are nulligravid/nulliparo us. The cumulative expulsion rate is 0.6 per 100 women-years at 3 year s and is not significantly higher in the nulligravid/nulliparous group . The cumulative pregnancy rate is 0.6 and the cumulative removal rate for medical reasons 3.2 at 3 years. The total experience in this mult icenter study covers approximately 14,000 woman-months. It is conclude d that the design characteristics of the GyneFix (TM) (fixed, frameles s, and flexible) explain the low expulsion, high efficacy and high acc eptability rates. The implantation technology is very effective and th e improved inserter allows easy insertion and optimal anchoring.