Scanning tunneling microscopy (STM) was used to investigate room tempe
rature adsorption and dissociation of SiH4 on Si(111)(7 X 7) surfaces.
The data show a pronounced site selectivity for this process. Initial
ly the reaction involves exclusively the corner holes and the adjacent
Si adatoms of the (7 X 7) reconstruction, with preferential adsorptio
n of SiH3 groups in the corner holes and of H atoms on one of the adja
cent corner adatoms. For higher SiH4 exposures the reactivity of the c
orner adatoms is significantly reduced, hydrogen adsorption occurs pre
ferentially on the center adatoms. Deposited SiHx groups (x = 2, 3) nu
cleate now in small clusters on the terraces. A higher density of thes
e SiHx clusters on domain boundaries or at steps indicates a higher re
activity of these defect sites.