QUANTIZATION OF ELECTRON-STATES IN ULTRATHIN XENON LAYERS

Citation
R. Paniago et al., QUANTIZATION OF ELECTRON-STATES IN ULTRATHIN XENON LAYERS, Surface science, 325(3), 1995, pp. 336-342
Citations number
23
Categorie Soggetti
Chemistry Physical
Journal title
ISSN journal
00396028
Volume
325
Issue
3
Year of publication
1995
Pages
336 - 342
Database
ISI
SICI code
0039-6028(1995)325:3<336:QOEIUX>2.0.ZU;2-D
Abstract
Physisorbed Xe was grown at temperatures T less than or equal to 55 K in a layer-by-layer mode on Ag(111) and Cu(100). High-resolution norma l-emission photoelectron spectra from the Xe 5p valence levels show cl ear evidence for a quantization of the electron states, depending on t he layer thickness. Their energies and their numbers can be explained within a very simple potential well model. We have also determined val ues for the electron mean free path in solid xenon from the attenuatio n of core level photoemission intensities.