CONDUCTION IN RUO2-BASED THICK-FILMS

Citation
K. Bobran et al., CONDUCTION IN RUO2-BASED THICK-FILMS, International journal of electronics, 78(1), 1995, pp. 113-119
Citations number
22
Categorie Soggetti
Engineering, Eletrical & Electronic
ISSN journal
00207217
Volume
78
Issue
1
Year of publication
1995
Pages
113 - 119
Database
ISI
SICI code
0020-7217(1995)78:1<113:CIRT>2.0.ZU;2-K
Abstract
The dependence of RuO2-glass thick-film electrical conductivity on the concentration of metallic component reveals a metal-insulator transit ion. Resistance versus temperature characteristics measured in the ran ge 4.2-400 K are presented for a set of seven composites of varying co mposition. The results obtained can be divided into two groups: compos ites incorporating greater than or equal to 0.12 (per unit volume) of metallic component yield minima of R(T) curves and possess parabola-li ke shapes, and composites with a small content of metallic component ( <0.12) show a negative temperature coefficient of resistance over the whole range of measured temperatures. In the insulating region, data a re analysed in terms of various conduction mechanisms, giving rise to an understanding of electrical conduction in RuO2-glass thick resistiv e films.