MICROWAVE CONDUCTIVITY STUDIES ON SOME SEMICONDUCTORS

Citation
V. Subramanian et al., MICROWAVE CONDUCTIVITY STUDIES ON SOME SEMICONDUCTORS, Pramana, 44(1), 1995, pp. 19-32
Citations number
31
Categorie Soggetti
Physics
Journal title
ISSN journal
03044289
Volume
44
Issue
1
Year of publication
1995
Pages
19 - 32
Database
ISI
SICI code
0304-4289(1995)44:1<19:MCSOSS>2.0.ZU;2-#
Abstract
The cavity perturbation technique is employed for the characterisation of semiconductors at microwave frequency for its conductivity. Temper ature variation of microwave conductivity studies provide the informat ion regarding the band gap, scattering parameter and impurity ionizati on energy. Change in the real part of the dielectric permittivity with conductivity indicates the change in the momentum relaxation time.