THE X-RAY-POLARIZATION SENSITIVITY OF CCDS

Authors
HOLLAND AD SHORT ADT FRASER GW TURNER MJL
Citation
Ad. Holland et al., THE X-RAY-POLARIZATION SENSITIVITY OF CCDS, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 355(2-3), 1995, pp. 526-531
Citations number
24
Categorie Soggetti
Nuclear Sciences & Tecnology","Physics, Particles & Fields","Instument & Instrumentation",Spectroscopy
Journal title
Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment → ACNP
ISSN journal
01689002
Volume
355
Issue
2-3
Year of publication
1995
Pages
526 - 531
Database
ISI
SICI code
0168-9002(1995)355:2-3<526:TXSOC>2.0.ZU;2-A
Abstract
The regular array of pixels in a silicon Charge Coupled Device (CCD) m ay be used to measure photoelectron emission directions following the absorption of high energy X-rays (E > 15 keV). CCDs offer, therefore, the possibility of combining X-ray imaging and spectroscopy with measu rement of the linear polarisation of the incident beam. We describe a simple model of electron transport in CCDs which leads to an estimate of the energy-dependent modulation factor M(E) - the parameter determi ning polarisation sensitivity - for arbitrary pixel geometries. The pr edictions of the model are in good agreement with published astronomy is assessed.