BIST FOR D A AND A D CONVERTERS

Authors
ARABI K KAMINSKA B RZESZUT J
Citation
K. Arabi et al., BIST FOR D A AND A D CONVERTERS, IEEE design & test of computers, 13(4), 1996, pp. 40-49
Citations number
12
Categorie Soggetti
Computer Sciences","Computer Science Hardware & Architecture
Journal title
IEEE design & test of computers → ACNP
ISSN journal
07407475
Volume
13
Issue
4
Year of publication
1996
Pages
40 - 49
Database
ISI
SICI code
0740-7475(1996)13:4<40:BFDAAA>2.0.ZU;2-7
Abstract
The expense of specialized equipment can be a problem in testing high- resolution converters. A BIST alternative that tests offset voltage, i ntegral nonlinearity, differential nonlinearity, and gain error withou t such equipment or the use of a digital signal processor or microcont roller shows promise.