EFFECT OF INTERGROWTH DEFECTS ON THE X-RAY-DIFFRACTION PATTERN

The presence of intergrowth with a different spacing inside a layered phase causes significant alterations in the X-ray diffraction pattern, concerning both line positions and widths. An analysis of these chang es, based on a Hendricks-Teller-type formalism yields estimates about the defect nature, concentration and short-range order. The procedure was exemplified by simulation of XRD patterns for Bi-based oxidic supe rconductors, in which intergrowths of related phases are often present inside the matrix phase.