LASER-ABLATION OF BISRCACUO SUPERCONDUCTING THIN-FILM - ANALYSIS OF INTERMEDIATE SPECIES IN REAL-TIME

Citation
U. Gambardella et al., LASER-ABLATION OF BISRCACUO SUPERCONDUCTING THIN-FILM - ANALYSIS OF INTERMEDIATE SPECIES IN REAL-TIME, Applied surface science, 86(1-4), 1995, pp. 45-49
Citations number
6
Categorie Soggetti
Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
Journal title
ISSN journal
01694332
Volume
86
Issue
1-4
Year of publication
1995
Pages
45 - 49
Database
ISI
SICI code
0169-4332(1995)86:1-4<45:LOBST->2.0.ZU;2-V
Abstract
The presence of oxygen during the ablation process of BiSrCaCuO leads to gas-phase production of oxides and might affect the growth and crys tallinity of the thin films. It is very probable that ground-state and excited oxides are formed in the plume. Reactive scattering of O-2 on Sr atoms producing SrO in an excited state is observed in emission sp ectroscopy (OMA III). XRD analysis of the behavior of the FWHM of 0010 and 0012 reflection lines is reported, as well as the SEM and EDS ana lysis of superconducting films.