We have investigated the ArF laser sputtering deposition of TiO2 anti-
reflection coatings, aiming at large scale production of II-VI and III
-V solar cells, the main theme of our research group. As a first step,
layers were deposited on silicon wafers and glass. A reasonable growt
h rate for production, considering possible pulse frequencies of a few
tens Hertz, of 0.1 Angstrom per 1 J/cm(-2) laser pulse energy density
was obtained. The structure of the oxide layer, interface and interdi
ffusion with the substrate are characterized using cross sectional hig
h resolution transmission electron microscopy and Rutherford backscatt
ering, as a function of substrate temperature on the one hand and argo
n, nitrogen and oxygen pressure during deposition on the other hand. T
he surface optical quality of the deposited films versus thickness and
growth conditions is presented. We will apply this technique to a sol
ar cell prototype and a GaSb based photodetector prototype fabricated
in our group.