MICROSTRUCTURAL CHARACTERIZATION OF ALPHA-GAN FILMS GROWN ON SAPPHIREBY ORGANOMETALLIC VAPOR-PHASE EPITAXY

Authors
QIAN W SKOWRONSKI M DEGRAEF M DOVERSPIKE K ROWLAND LB GASKILL DK
Citation
W. Qian et al., MICROSTRUCTURAL CHARACTERIZATION OF ALPHA-GAN FILMS GROWN ON SAPPHIREBY ORGANOMETALLIC VAPOR-PHASE EPITAXY, Applied physics letters, 66(10), 1995, pp. 1252-1254
Citations number
18
Categorie Soggetti
Physics, Applied
Journal title
Applied physics letters → ACNP
ISSN journal
00036951
Volume
66
Issue
10
Year of publication
1995
Pages
1252 - 1254
Database
ISI
SICI code
0003-6951(1995)66:10<1252:MCOAFG>2.0.ZU;2-X