K. Wien et A. Spieth, SECONDARY-ION EMISSION FROM FROZEN ARGON BY CF-252 FISSION FRAGMENTS, Rapid communications in mass spectrometry, 9(3), 1995, pp. 221-224
In order to study sputtering of Van-der-Waals solids by MeV ion impact
, films of solid argon condensed onto a metallic substrate at a temper
ature of 10 K were irradiated by Cf-252 fission fragments. The seconda
ry ions emitted from the surface were investigated by a time-of-flight
technique. The mass spectra are dominated by a cluster series Ar-n(+)
with n ranging from 1 to about 30. Comparatively high absolute ion yi
elds were determined; the yield of Ar+ was 48 ions/impact. The mass li
ne of Ar+ was broadened due to ejection energies of up to 50 eV. The l
ine shape of the cluster ions indicates delayed particle emission. Som
e of the observed phenomena are not typical for electronic sputtering
at MeV energies; they are briefly discussed. These are the first and p
reliminary results of a systematic exploration of high energy sputteri
ng from solid rare gases.