SYNTHESIS AND CHARACTERIZATION OF TIO2 THIN-FILMS ON ORGANIC SELF-ASSEMBLED MONOLAYERS .2. FILM FORMATION VIA AN ORGANOMETALLIC ROUTE

Citation
H. Shin et al., SYNTHESIS AND CHARACTERIZATION OF TIO2 THIN-FILMS ON ORGANIC SELF-ASSEMBLED MONOLAYERS .2. FILM FORMATION VIA AN ORGANOMETALLIC ROUTE, Journal of materials research, 10(3), 1995, pp. 699-703
Citations number
14
Categorie Soggetti
Material Science
ISSN journal
08842914
Volume
10
Issue
3
Year of publication
1995
Pages
699 - 703
Database
ISI
SICI code
0884-2914(1995)10:3<699:SACOTT>2.0.ZU;2-B
Abstract
Crystalline, uniform, adherent, ultrathin films of TiO2 were deposited onto OH-functionalized organic self-assembled monolayers (SAMs) on si ngle-crystalline Si at low-temperature (<100 degrees C) from anhydrous ethanolic solutions of titanium isopropoxide. The films were identifi ed as TiO2 by x-ray photoelectron spectroscopy, electron diffraction, and energy-dispersive x-ray microanalysis. Transmission electron micro scopy showed the films to be uniform in thickness (2 +/- 0.5 nm) and c ontinuous. On bare Si, in contrast, there was no evidence of TiO2 depo sition under identical conditions, Unlike the anatase films deposited on SAMs from aqueous solutions (described in the preceding paper), the electron diffraction patterns of the films deposited from alkoxide so lutions suggest that they were the rutile phase, It is suggested that the functionalized SAMs enable the anchoring of the Ti alkoxide and in itiate the formation of an adherent oxide film, and that they are suff iciently uniform that the resulting film is continuous and uniform in thickness.