Yk. Chung et al., SYNTHESIS, STRUCTURAL AND ELECTRICAL CHARACTERIZATIONS OF PR2-XBAXNIO4+ -DELTA/, Bulletin of the Korean Chemical Society, 16(2), 1995, pp. 120-125
Solid solutions of Pr2-xBaxNiO4+/-delta with K2NiF4-type structure wer
e prepared in air and characterized by powder X-ray diffraction, Rietv
eld refinements, iodometry titrations, and conductivity measurements.
The range of the solid solution was 0 less than or equal to x<0.5. The
crystal structure changes from orthorhombic (Fmmm) for x less than or
equal to 10.1 to pseudo-tetragonal (I4/mmm) for x greater than or equ
al to 0.2. The orthorhombic structure of x=0.1 transforms to tetragona
l at low temperature. The bond distances obtained from the Rietveld an
alyses did not vary significantly with the Ba content except that of N
i-O (parallel to the c-axis) which showed an abrupt increase from x=0.
1 to 0.2. The excess oxygen content (delta) decreases from 0.241 to 0.
03 with increasing substituted Ba contents within the solution range.
The samples are all semiconductors at the temperature range 4<T<300 K.