P. Baulaigue et al., HOLOGRAPHIC STUDY OF NON DESTRUCTIVE THERMAL-STRESS IN MULTIDIELECTRIC FILMS COATED FOR 10,6 MU-M, Journal of optics, 25(6), 1994, pp. 225-229
We have developed a interferometric method, using holography, so that
a thermal stress of a multidielectric coating deposited on glass subje
ct to continuous laser flow at CO2 power can be observed in real time.
This method is used with an image acquisition system so that computer
processing of the observed fringes is possible.