ELECTRON-DIFFRACTION STUDY OF THE TEXTURE OF CADMIUM SELENIDE THIN-FILMS

Citation
D. Samanta et al., ELECTRON-DIFFRACTION STUDY OF THE TEXTURE OF CADMIUM SELENIDE THIN-FILMS, Indian Journal of Pure & Applied Physics, 32(11), 1994, pp. 909-911
Citations number
NO
Categorie Soggetti
Physics
ISSN journal
00195596
Volume
32
Issue
11
Year of publication
1994
Pages
909 - 911
Database
ISI
SICI code
0019-5596(1994)32:11<909:ESOTTO>2.0.ZU;2-T
Abstract
Different parameters like texture coefficient, standard deviation, mea n disorientation angle and energy characterizing the degree of preferr ed orientation of CdSe films deposited on glass and mica substrates ha ve been determined from transmission electron diffraction studies. Inf luence of the substrate temperature on the extent of preferred orienta tion has been studied.