USE OF THE DIRICHLET PROCESS FOR RELIABILITY-ANALYSIS

Authors
CHIEN WTK KUO W
Citation
Wtk. Chien et W. Kuo, USE OF THE DIRICHLET PROCESS FOR RELIABILITY-ANALYSIS, Computers & industrial engineering, 27(1-4), 1994, pp. 339-343
Citations number
9
Categorie Soggetti
Computer Application, Chemistry & Engineering","Computer Science Interdisciplinary Applications","Engineering, Industrial
Journal title
Computers & industrial engineering → ACNP
ISSN journal
03608352
Volume
27
Issue
1-4
Year of publication
1994
Pages
339 - 343
Database
ISI
SICI code
0360-8352(1994)27:1-4<339:UOTDPF>2.0.ZU;2-E
Abstract
Recently, many researchers apply the non-parametric Bayesian approach to predict the reliability of highly complex electronic systems. The D irichlet process is the most common model for the non-parametric Bayes ian analysis. The Kuo's simulation procedure [6] for Dirichlet process under a variance reduction techniques introduced in Chien and Kuo (19 94) [2] is applied for a Weibull-distributed system. Optimal burn-in t ime is determined given the cost parameters. A model, the percentage o f good items in a lot, is used to explain when the Dirichlet process i s not a proper choice.