Laves phase DyFe2 thin films have been epitaxially grown with [110] as
the growth direction. Reflection high-energy electron diffraction pat
terns confirm the quality of epitaxy and x-ray diffraction measurement
s evidence that the films are strained compared to the bulk alloy. Mos
sbauer spectroscopy spectra and Kerr rotation measurements show that t
he easy magnetization direction varies from [100] at 4.2 K to around [
<(2)over bar 41>] at 300 K. This is consequently different from the bu
lk-compound easy axis ([100] from 4.2 K to room temperature). This eff
ect is new and can be qualitatively understood if we consider the infl
uence of the strains induced by epitaxy on the various energy terms wh
ich govern the easy magnetization direction.