SPECTROSCOPIC ELLIPSOMETRY STUDY OF CERIUM DIOXIDE THIN-FILMS GROWN ON SAPPHIRE BY RF MAGNETRON SPUTTERING

Authors
GUO S ARWIN H JACOBSEN SN JARRENDAHL K HELMERSSON U
Citation
S. Guo et al., SPECTROSCOPIC ELLIPSOMETRY STUDY OF CERIUM DIOXIDE THIN-FILMS GROWN ON SAPPHIRE BY RF MAGNETRON SPUTTERING, Journal of applied physics, 77(10), 1995, pp. 5369-5376
Citations number
29
Categorie Soggetti
Physics, Applied
Journal title
Journal of applied physics → ACNP
ISSN journal
00218979
Volume
77
Issue
10
Year of publication
1995
Pages
5369 - 5376
Database
ISI
SICI code
0021-8979(1995)77:10<5369:SESOCD>2.0.ZU;2-I