ATOMIC-FORCE MICROSCOPY AND RAMAN-SPECTROSCOPY STUDIES ON THE OXIDATION OF CU THIN-FILMS

Citation
Ys. Gong et al., ATOMIC-FORCE MICROSCOPY AND RAMAN-SPECTROSCOPY STUDIES ON THE OXIDATION OF CU THIN-FILMS, Journal of applied physics, 77(10), 1995, pp. 5422-5425
Citations number
12
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
77
Issue
10
Year of publication
1995
Pages
5422 - 5425
Database
ISI
SICI code
0021-8979(1995)77:10<5422:AMARSO>2.0.ZU;2-R